Measuring Lattice Strain in Three Dimensions through Electron Microscopy.
Measuring Lattice Strain in Three Dimensions through Electron Microscopy.
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DOI：
10.1021/acs.nanolett.5b03008
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发表时间：
2015-10-14
期刊：
影响因子：
10.8
通讯作者：
Van Tendeloo G
中科院分区：
文献类型：
--
作者：
Goris B;De Beenhouwer J;De Backer A;Zanaga D;Batenburg KJ;Sánchez-Iglesias A;Liz-Marzán LM;Van Aert S;Bals S;Sijbers J;Van Tendeloo G
纳米材料的三维（3D）原子结构，包括应变，对于理解它们的性质至关重要。在这里，我们调查晶格应变在Au nanodecahedra使用电子断层扫描。尽管不同的电子断层扫描技术能够在原子水平上对纳米结构进行3D表征，但晶格应变的可靠确定并不简单。因此，我们提出了一种新的基于模型的方法，从原子坐标测量。我们的研究结果表明，在三维晶格应变调查的重要性。
The three-dimensional (3D) atomic structure of nanomaterials, including strain, is crucial to understand their properties. Here, we investigate lattice strain in Au nanodecahedra using electron tomography. Although different electron tomography techniques enabled 3D characterizations of nanostructures at the atomic level, a reliable determination of lattice strain is not straightforward. We therefore propose a novel model-based approach from which atomic coordinates are measured. Our findings demonstrate the importance of investigating lattice strain in 3D.