Experimental demonstration for scanning near-field optical microscopy using a metal micro-slit probe at millimeter wavelengths
Experimental demonstration for scanning near-field optical microscopy using a metal micro-slit probe at millimeter wavelengths
复制标题
使用金属微缝探针在毫米波长下扫描近场光学显微镜的实验演示
DOI：
10.1063/1.120397
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发表时间：
1997
影响因子：
4
通讯作者：
T. Nozokido
中科院分区：
文献类型：
--
作者：
J. Bae;T. Okamoto;T. Fujii;K. Mizuno;T. Nozokido
讨论了狭缝型探针扫描近场光学显微镜。狭缝型探针具有远小于波长λ的宽度和λ量级的长度，因此具有高传输效率。基于计算机断层成像的图像重建算法，可以得到物体的二维近场图像。在60 GHz（λ=5 mm）下进行的实验表明，这种近场显微镜可以实现优于λ/45的二维成像空间分辨率。本文提出了一种在光纤端部制作亚微米宽度狭缝探针的方法，以将这种显微术扩展到光波。
Scanning near-field optical microscopy using a slit-type probe is discussed. The slit-type probe has a width of much less than a wavelength, λ, and a length on the order of λ, and thus has high transmission efficiency. Two dimensional near-field images of objects have been constructed using an image reconstruction algorithm based on computerized tomographic imaging. Experiments performed at 60 GHz (λ=5 mm) show that this type of near-field microscopy can achieve a spatial resolution of better than λ/45 for two dimensional imaging. A method for fabricating a submicron width slit probe at the end of an optical fiber is presented for extending this microscopy to optical waves.