Current-induced Instability in Ag and Cu Nanocontacts
Current-induced Instability in Ag and Cu Nanocontacts
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银和铜纳米接触中电流引起的不稳定性
DOI：
10.1380/ejssnt.2004.155
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发表时间：
2004
影响因子：
0.7
通讯作者：
A. Sakai
中科院分区：
文献类型：
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作者：
A. Fujii;S. Kurokawa;A. Sakai
我们研究了Ag和Cu断开纳米接触的高偏压电导，发现它们的瞬态电导迹线经常表现出突然的电导波动和随后的快速接触断开，与我们先前在Au纳米接触上观察到的接触不稳定性相同[A. Fujii等人，E-J冲浪Sci.纳米技术2，125（2004）]。如在Au的情况下，电导波动倾向于在优选的阈值电导Gth处发生，发现该阈值电导Gth与接触电流I成比例地增加。该直线I-Gth图的斜率表示电导波动开始的临界电流密度jc。我们的实验结果表明，Ag和Cu的I-Gth曲线与Au的I-Gth曲线几乎相同，表明三种贵金属纳米接触的jc值相似。[DOI：10.1380/ejssnt.2004.155]
We studied high-bias conductance of Ag and Cu breaking nanocontacts and found that their transient conductance traces often exhibit a sudden conductance fluctuation and a subsequent rapid contact break, the same contact instability as we previously observed on Au nanocontacts [A. Fujii, et al., e-J. Surf. Sci. Nanotech. 2, 125 (2004)]. As in the case of Au, the conductance fluctuation tends to take place at a preferred threshold conductance Gth, which is found to increase in proportion to the contact current I. The slope of this straight I-Gth plot represents the critical current density jc for the onset of the conductance fluctuation. Our experimental results show that I-Gth plots of Ag and Cu are nearly the same as that of Au, suggesting similar jc values for three noble metal nanocontacts. [DOI:10.1380/ejssnt.2004.155]
电流引起的原子大小金属接触的破坏
DOI：
--
发表时间：
2008
期刊：
影响因子：
--
作者：
Daisuke;Miura;Shu;Kurokawa;Akira;Sakai
通讯作者：
Sakai