Ultrafast electrical measurements of polarization dynamics in ferroelectric thin-film capacitors
Ultrafast electrical measurements of polarization dynamics in ferroelectric thin-film capacitors
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DOI:
10.1063/1.3665209
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发表时间:
2011-12-01
影响因子:
1.6
通讯作者:
McCampbell, John
中科院分区:
文献类型:
--
作者:
Grigoriev, Alexei;Azad, Mandana Meisami;McCampbell, John
We have developed a new approach to measure fast electrical signals during polarization switching in ferroelectric thin-film capacitors. This article describes a simple method for probing transient currents and voltages in a broad range of time scales from microseconds to hundreds of picoseconds. In order to test our approach, we probed polarization dynamics in commercial PbZr0.2Ti0.8O3 ferroelectric capacitors in which the measured switching time was as fast as 1.7 ns. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3665209]