Ultrafast electrical measurements of polarization dynamics in ferroelectric thin-film capacitors

Ultrafast electrical measurements of polarization dynamics in ferroelectric thin-film capacitors
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DOI:
10.1063/1.3665209
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发表时间:
2011-12-01
影响因子:
1.6
通讯作者:
McCampbell, John
McCampbell, John
中科院分区:
工程技术4区
文献类型:
--
作者:
Grigoriev, Alexei;Azad, Mandana Meisami;McCampbell, John

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我们开发了一种新方法,用于测量铁电薄膜电容器极化翻转过程中的快速电信号。本文介绍了一种简单的方法,用于在从微秒到数百皮秒的广泛时间尺度内探测瞬态电流和电压。为了测试我们的方法,我们探测了商用PbZr₀.₂Ti₀.₈O₃铁电电容器中的极化动力学,其中测得的翻转时间快至1.7纳秒。(C)2011美国物理学会。[doi:10.1063/1.3665209]
We have developed a new approach to measure fast electrical signals during polarization switching in ferroelectric thin-film capacitors. This article describes a simple method for probing transient currents and voltages in a broad range of time scales from microseconds to hundreds of picoseconds. In order to test our approach, we probed polarization dynamics in commercial PbZr0.2Ti0.8O3 ferroelectric capacitors in which the measured switching time was as fast as 1.7 ns. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3665209]