Attosecond chronoscopy of electron scattering in dielectric nanoparticles

Attosecond chronoscopy of electron scattering in dielectric nanoparticles
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DOI:
10.1038/nphys4129
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发表时间:
2017-08-01
期刊:
影响因子:
19.6
通讯作者:
Kling, M. F.
Kling, M. F.
中科院分区:
物理与天体物理1区
文献类型:
--
作者:
Seiffert, L.;Liu, Q.;Kling, M. F.

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介电材料中的电子散射是激光纳米加工 (1)、光驱动电子学 (2) 和辐射损伤 (3-5) 的核心。在这里,我们通过在介电纳米粒子上实施阿秒条纹光谱来演示电子散射的实时获取:光电子在纳米粒子内部产生,并且它们在材料中的传输和光电子发射都在阿秒时间尺度上进行跟踪。我们开发了电介质中阿秒条纹光谱的理论框架,并确定材料内部内部场的存在消除了弹性散射的影响,从而能够选择性地表征非弹性散射时间。该方法在二氧化硅纳米颗粒上进行了演示,其中提取了 20-30 eV 的非弹性平均自由路径。我们的方法能够表征各种介电固体和液体(包括水)中的非弹性散射,可以以液滴的形式进行研究。
The scattering of electrons in dielectric materials is central to laser nanomachining(1), light-driven electronics(2) and radiation damage(3-5). Here, we demonstrate real-time access to electron scattering by implementing attosecond streaking spectroscopy on dielectric nanoparticles: photoelectrons are generated inside the nanoparticles and both their transport through the material and photoemission are tracked on an attosecond timescale. We develop a theoretical framework for attosecond streaking spectroscopy in dielectrics and identify that the presence of the internal field inside the material cancels the influence of elastic scattering, enabling the selective characterization of the inelastic scattering time. The approach is demonstrated on silica nanoparticles, where an inelastic mean-free path is extracted for 20-30 eV. Our approach enables the characterization of inelastic scattering in various dielectric solids and liquids, including water, which can be studied in the form of droplets.