Characterization of AC mode scanning ion-conductance microscopy
Characterization of AC mode scanning ion-conductance microscopy
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DOI：
10.1016/s0304-3991(01)00096-1
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发表时间：
2001-11-01
期刊：
影响因子：
2.2
通讯作者：
Shao, ZF
中科院分区：
文献类型：
--
作者：
Pastré, D;Iwamoto, H;Shao, ZF
最近研制了一种带有振动探头的扫描离子电导显微镜(VSICM)。在该系统中，交流离子电流的幅值通过锁定到探头振动频率的锁定放大器来检测。这种方案允许更好地控制针尖位置，因为交流离子电流比以前使用的直流离子电流对探头表面距离更敏感。在本文中，我们展示了这种技术在地形粗糙的样品成像和选定小区域的高分辨率成像中的应用。我们还表明，在扫描过程中同时记录直流离子电流是可能的，这可以揭示用交流离子电流获得的图像中不明显的附加信息。(C)2001 Elsevier Science B.V.保留所有权利。
A scanning ion-conductance microscope (SICM) with a vibrating probe has been recently developed (vSICM). In this system, the amplitude of the AC ionic current is detected by using a lock-in amplifier locked to the vibration frequency of the probe. Such a scheme allows for a better control of the tip position because the AC ionic current is more sensitive to the probe-surface distance than the DC ionic current used previously. In this paper, we demonstrate the utility of this technique to the imaging of topographically rough specimens and high-resolution imaging over selected small areas. We also show that it is possible to record the DC ionic current simultaneously during the scan, which can reveal additional information not apparent in the images obtained with the AC ionic current. (C) 2001 Elsevier Science B.V. All rights reserved.