Determination of Evanescent Electric Field Decay Length of Metallic Nanodisks by Using Localized Surface Plasmon Spectroscopy
Determination of Evanescent Electric Field Decay Length of Metallic Nanodisks by Using Localized Surface Plasmon Spectroscopy
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发表时间：
2010-11
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通讯作者：
G. Barbillon
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作者：
G. Barbillon
本文测定了电子束光刻形成的金属纳米盘阵列的倏逝场衰减长度。从局域表面等离子体共振光谱，这个电场衰减长度ld得到了一个简单的模型的帮助。结果表明，l（下标d）随长径比（直径/高度）的增大而增大。基于时域有限差分的严格理论计算证实了我们的实验结果。
In this paper, the evanescent electric field decay length of metallic nanodisks array patterned by electron beam lithography has been determined. From localized surface plasmon resonance spectroscopy, this electric field decay length ld was obtained with the help of a simple model. It has been demonstrated that l(subscript d) increased with the aspect ratio (diameter/height). Rigourous theoretical calculations based on the finite difference time domain confirm our experimental results.