Study of Magnetic Stray Field Measurement on Surface Using New Force Microscope

Study of Magnetic Stray Field Measurement on Surface Using New Force Microscope
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新力显微镜表面杂散磁场测量研究

DOI：
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发表时间：
1992
期刊：
影响因子：
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通讯作者：
Hajime Koyanagi Hajime Koyanagi
Hajime Koyanagi Hajime Koyanagi
中科院分区：
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文献类型：
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作者：
S. Hosaka;A. Kikukawa;Yukio Honda Yukio Honda;Hajime Koyanagi Hajime Koyanagi

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利用一种新型的力显微镜和光束偏转力检测器对表面杂散磁场进行了研究。通过使用恒定排斥力控制和磁力梯度测量，可以进行测量。该显微镜可以同时提供磁力梯度图像和表面结构图像。初步结果表明，该方法可以获得磁光盘的表面杂散磁场和表面结构图像。该方法为测量表面杂散磁场提供了可行性。
Surface magnetic stray fields are studied using a new force microscope with an optical beam deflection force detector. The measurements are made possible by using both a constant repulsive force control and a magnetic force gradient measurement. The microscope can simultaneously provide a magnetic force gradient image and a surface structure image. Initial results demonstrate that the surface magnetic stray field and the surface structure image of a magneto-optical disk can be obtained. The new method provides feasibility of measuring the surface magnetic stray field.