Comparison Between Potentiometric and Stripping Voltammetric Detection of Trace Metals: Measurements of Cadmium and Lead in the Presence of Thalium, Indium, and Tin.
Comparison Between Potentiometric and Stripping Voltammetric Detection of Trace Metals: Measurements of Cadmium and Lead in the Presence of Thalium, Indium, and Tin.
复制标题
微量金属的电位法和溶出伏安法检测的比较:铊、铟和锡存在下镉和铅的测量。
DOI:
10.1002/elan.200904613
复制
发表时间:
2009
期刊:
影响因子:
3
通讯作者:
Wang,Joseph
中科院分区:
文献类型:
--
作者:
Chumbimuni-Torres,KarinY;Calvo-Marzal,Percy;Wang,Joseph
Recent advances in ion‐selective electrodes have pushed the detection limits of direct potentiometry to the nanomolar concentration range. Here we present a direct comparison of the sensitivity and selectivity of potentiometric and stripping‐voltammetric measurements of cadmium and lead. While both techniques offer a similar sensitivity, the potentiometric method offers higher selectivity in the presence of excess of metal ions (e.g., thallium, tin) that commonly interfere in the stripping‐voltammetric operation. Because of the complementary nature of the potentiometric and stripping‐voltammetric methods, it is recommended that these techniques will be selected based on the specific analytical problem or used in parallel to provide additional analytical information.