Internal Electric Field Investigations of a Cadmium Zinc Telluride Detector Using Synchrotron X-ray Mapping and Pockels Effect Measurements
Internal Electric Field Investigations of a Cadmium Zinc Telluride Detector Using Synchrotron X-ray Mapping and Pockels Effect Measurements
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DOI：
10.1007/s11664-009-0799-y
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发表时间：
2009-04
影响因子：
2.1
通讯作者：
G. Yang;A. Bolotnikov;G. Camarda;Y. Cui;A. Hossain;H. Yao;R. James
中科院分区：
文献类型：
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作者：
G. Yang;A. Bolotnikov;G. Camarda;Y. Cui;A. Hossain;H. Yao;R. James
碲锌镉（CZT）作为室温核辐射探测器材料具有广阔的应用前景，一直是研究的热点。在影响探测器性能的几个参数中，一个重要的参数是内部电场的分布。布鲁克海文国家实验室（BNL）采用同步辐射X射线微尺度映射和普克尔斯效应的测量来研究CZT条探测器中的内部电场分布。获得了位错能够扭曲探测器内部电场的直接证据。此外，还发现CZT晶体中的“星星”缺陷可能是位错环穿孔引起的，它会引起电荷俘获。
Cadmium zinc telluride (CZT) has remained a major focus of research due to its promising application as a room-temperature nuclear radiation detector material. Among the several parameters that substantially affect the detectors’ performance, an important one is the distribution of the internal electric field. Brookhaven National Laboratory (BNL) employed synchrotron x-ray microscale mapping and measurements of the Pockels effect to investigate the distribution of the internal electric field in a CZT strip detector. Direct evidence that dislocations can distort the internal electric field of the detector was obtained. Furthermore, it was found that “star” defects in the CZT crystal, possibly ascribed to dislocation loop punching, cause charge trapping.