On the testing of the magnetic field integral equation with RWG basis functions in method of moments
On the testing of the magnetic field integral equation with RWG basis functions in method of moments
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DOI：
10.1109/8.964090
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发表时间：
2001-11
影响因子：
5.7
通讯作者：
J. Rius;E. Ubeda;J. Parrón
中科院分区：
文献类型：
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作者：
J. Rius;E. Ubeda;J. Parrón
在矩量法的电磁分析中，三维任意导电表面通常采用Rao、Wilton和Glisson基函数离散。磁场积分方程（MFIE）的MoM Galerkin离散化包括等于测试点处的表面外部的立体角的因子/spl Ω//sub 0/，其在物体表面上的任何地方都是2/spl π/，除了在构成零测量集的边缘或尖端处。然而，具有/spl Ω//sub 0/=2/spl π/的MFIE的标准公式对于电小的锐边物体导致不准确的结果。本文提出了一种修正/spl Ω//sub 0/因子，在MFIE中使用Galerkin测试，给出了与电场积分方程（EFIE）相当的精度，其对于小的尖锐边缘物体表现得非常好，可以作为参考。
For electromagnetic analysis using method of moments (MoM), three-dimensional (3-D) arbitrary conducting surfaces are often discretized in Rao, Wilton and Glisson basis functions. The MoM Galerkin discretization of the magnetic field integral equation (MFIE) includes a factor /spl Omega//sub 0/ equal to the solid angle external to the surface at the testing points, which is 2/spl pi/ everywhere on the surface of the object, except at the edges or tips that constitute a set of zero measure. However, the standard formulation of the MFIE with /spl Omega//sub 0/=2/spl pi/ leads to inaccurate results for electrically small sharp-edged objects. This paper presents a correction to the /spl Omega//sub 0/ factor that, using Galerkin testing in the MFIE, gives accuracy comparable to the electric field integral equation (EFIE), which behaves very well for small sharp-edged objects and can be taken as a reference.