Dynamic measurements at up to 130-kHz sampling rates using Ti:sapphire dual-comb distance metrology
Dynamic measurements at up to 130-kHz sampling rates using Ti:sapphire dual-comb distance metrology
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DOI：
10.1364/oe.433871
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发表时间：
2021-12-06
期刊：
影响因子：
3.8
通讯作者：
Reid, Derryck T.
中科院分区：
文献类型：
--
作者：
Mitchell, Toby;Sun, Jinghua;Reid, Derryck T.
通过使用完全锁定的钛：蓝宝石梳重复频率为513 MHz的操作，我们展示了高速双梳距离计量与更新速率高达130 kHz，相当于7.7 μ s的采样间隔。该测量带宽通过将检测限制在远小于脉冲带宽的波长范围内来实现，使得能够在2.6 ms的时间内达到干涉测量精度，并且在100 ms内产生2 nm的精度。重复频率实现了29.2 cm的瞬时无模糊范围，而高采样率提供了进行动态测量的能力，这是通过使用该系统通过记录安装在扬声器上的反射镜的位移来直接采样音频波形来证明的。由The Optical Society根据知识共享署名4.0许可证条款发布。
By using fully-locked Ti:sapphire combs operating with repetition-frequencies of 513 MHz, we demonstrate high-speed dual-comb distance metrology with update rates up to 130 kHz, equivalent to a sampling interval of 7.7 mu s. This measurement bandwidth is achieved by limiting detection to a wavelength range much less than the pulse bandwidth, enabling interferometric precision to be reached in a time of 2.6 ms and yielding a precision of 2 nm in 100 ms. The repetition frequency achieves an instantaneous non-ambiguity range of 29.2 cm, while the high sampling rate provides the ability to make dynamic measurements, which is demonstrated by using the system to directly sample audio waveforms by recording the displacement of a mirror mounted on a loudspeaker. Published by The Optical Society under the terms of the Creative Commons Attribution 4.0 License.