A biased anode to suppress ion back-bombardment in a DC high voltage photoelectron gun
A biased anode to suppress ion back-bombardment in a DC high voltage photoelectron gun
复制标题
直流高压光电子枪中抑制离子反向轰击的偏置阳极
DOI:
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发表时间:
2008
期刊:
影响因子:
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通讯作者:
K. Surles
中科院分区:
文献类型:
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作者:
J. Grames;P. Adderley;J. Brittian;J. Clark;J. Hansknecht;D. Machie;M. Poelker;E. Pozdeyev;M. Stutzman;K. Surles
Ion back‐bombardment is the dominant mechanism that limits the operating lifetime of DC high voltage GaAs photoelectron guns. In this work, an electrically isolated anode electrode was used to distinguish the QE damage contributions of ions produced within the cathode/anode gap and those produced downstream of the anode. This new anode design provides a means to suppress QE decay due to ionized gas in the beam line.