The Properties of Ferroelectric Films at Small Dimensions
The Properties of Ferroelectric Films at Small Dimensions
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DOI：
10.1146/annurev.matsci.30.1.263
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发表时间：
2000
期刊：
影响因子：
--
通讯作者：
T. Shaw;S. Trolier-McKinstry;P. McIntyre
中科院分区：
文献类型：
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作者：
T. Shaw;S. Trolier-McKinstry;P. McIntyre
摘要本文综述了铁电材料中尺寸效应的文献，重点介绍了钙钛矿薄膜铁电材料。讨论了边界条件、缺陷化学、电极界面、表面层和微观结构在控制铁电薄膜性能测量中的作用，以及观察到的与体性能的偏差。给出了尺寸效应在低场和高场介电性能、压电效应和薄膜泄漏行为方面的表现。
▪ Abstract This paper reviews the literature on size effects in ferroelectric materials, with an emphasis on thin film perovskite ferroelectrics. The roles of boundary conditions, defect chemistry, electrode interfaces, surface layers, and microstructure in controlling the measured properties of ferroelectric films, as well as the observed deviation from bulk properties are discussed. Examples of the manifestation of size effects in terms of the low and high field dielectric properties, the piezoelectric effect, and the leakage behavior of films are given.