Development and Application of Multiple-Probe Scanning Probe Microscopes

Development and Application of Multiple-Probe Scanning Probe Microscopes
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DOI:
10.1002/adma.201200257
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发表时间:
2012-04-03
期刊:
影响因子:
29.4
通讯作者:
Aono, Masakazu
Aono, Masakazu
中科院分区:
材料科学1区
文献类型:
--
作者:
Nakayama, Tomonobu;Kubo, Osamu;Aono, Masakazu

文献摘要

被引文献

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在基于纳米科学和纳米技术的先进材料的研究中,通常需要在给定样品的指定位置测量纳米尺度的局部电导率。为此,已经开发了多探针扫描探针显微镜(MP-SPM),其中两个、三个或四个扫描隧道显微镜(STM)或原子力显微镜(AFM)探针独立操作。MP-SPM中的每个探头不仅用于观察高分辨率的STM或AFM图像,而且还用于形成能够进行纳米级局部电导率测量的电接触。作者开发的世界上第一台双探针扫描隧道显微镜(DP-STM),后来被改进为三探针扫描隧道显微镜(TP-STM),已被用于测量一维金属纳米线和碳纳米管以及二维分子薄膜的电导。还研制了四探针扫描隧道显微镜(QP-STM),用于测量二维分子膜的电导率,而不会模糊探针与样品之间的接触电阻。此外,还研制了一台四探针原子力显微镜(QP-AFM),该原子力显微镜带有四个导电的音叉型自检测力传感器,用于测量绝缘衬底上纳米结构的电导率。还开发了同时控制四个探头的通用计算机软件,并用于QP-AFM的操作。本文综述了MP-SPM的研究进展和应用情况。
In the research of advanced materials based on nanoscience and nanotechnology, it is often desirable to measure nanoscale local electrical conductivity at a designated position of a given sample. For this purpose, multiple-probe scanning probe microscopes (MP-SPMs), in which two, three or four scanning tunneling microscope (STM) or atomic force microscope (AFM) probes are operated independently, have been developed. Each probe in an MP-SPM is used not only for observing high-resolution STM or AFM images but also for forming an electrical contact enabling nanoscale local electrical conductivity measurement. The world's first double-probe STM (DP-STM) developed by the authors, which was subsequently modified to a triple-probe STM (TP-STM), has been used to measure the conductivities of one-dimensional metal nanowires and carbon nanotubes and also two-dimensional molecular films. A quadruple-probe STM (QP-STM) has also been developed and used to measure the conductivity of two-dimensional molecular films without the ambiguity of contact resistance between the probe and sample. Moreover, a quadruple-probe AFM (QP-AFM) with four conductive tuning-fork-type self-detection force sensing probes has been developed to measure the conductivity of a nanostructure on an insulating substrate. A general-purpose computer software to control four probes at the same time has also been developed and used in the operation of the QP-AFM. These developments and applications of MP-SPMs are reviewed in this paper.