Simultaneous Measurement of Near Tip Stress Field of Fast Propagating Cracks by Double Exposure Holography and Fizeau-type Interferomtry
Simultaneous Measurement of Near Tip Stress Field of Fast Propagating Cracks by Double Exposure Holography and Fizeau-type Interferomtry
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双曝光全息术和斐索型干涉同步测量快速扩展裂纹近尖端应力场
DOI：
10.11395/jjsem.17.250
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发表时间：
2017
期刊：
影响因子：
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通讯作者：
鈴木新一，沼田喜弥，中出貴裕
中科院分区：
文献类型：
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作者：
Akitaka Nomoto;Hiroki Yasutaka;Sho Oketani;Akihiro Matsuda;桶谷 翔，野本 明誉，松田 昭博;桶谷翔，野本明誉，松田昭博，加藤和人;野本明誉，桶谷翔，松田昭博;鈴木新一;鈴木新一，沼田喜弥，中出貴裕
采用二次曝光全息术和菲佐干涉法同时测量了厚度稍不均匀的PMMA平板试件快速扩展裂纹附近的应力场。二次曝光全息术的灵敏度约为菲佐干涉术的四分之一，但它只能测量裂纹尖端附近的应力集中引起的样品厚度变化，而不会因样品厚度的不均匀而引起干涉条纹的变形。测量结果表明，条纹级数对距裂尖距离的导数与距裂尖距离的-3/2次方成正比，符合平面应力奇异应力场理论。由干涉条纹还得到了应力强度因子。结果表明，即使在费索干涉法不能给出受试件厚度不均匀影响的真实值的情况下，二次曝光全息术也能获得应力强度因子的真实值。
Double exposure holography and Fizeau-type interferometry are simultaneously applied to measure the stress field in the vicinity of fast propagating cracks in PMMA plate specimens whose thickness is slightly non-uniform. The sensitivity of double exposure holography is about a quarter as high as that of Fizeau-type interferometry, however, it can measure only the change in specimen thickness caused by the stress concentration near the crack tip without distortion of interference fringes by the non-uniformity of specimen thickness. Measurement results say that the derivatives of fringe order with respect to the distance from the crack tip are proportional to the-3/2th power of the distance from the crack tip, which is in agreement with the theory of singular stress field of plane stress. The stress intensity factors are also obtained from the interference fringes. It is shown that double exposure holography can obtain true value of stress intensity factor even in the condition that Fizeau-type interferometry cannot give the true value being affected by the non-uniformity of specimen thickness.