Reflection measurement technique of electro‐optic coefficients in lithium niobate crystals and poled polymer films
Reflection measurement technique of electro‐optic coefficients in lithium niobate crystals and poled polymer films
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铌酸锂晶体和极化聚合物薄膜电光系数的反射测量技术
DOI：
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发表时间：
1995
期刊：
影响因子：
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通讯作者：
M. Amano
中科院分区：
文献类型：
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作者：
Y. Shuto;M. Amano
Teng 和 Man 提出的一种简单的反射技术 [Appl.物理。莱特。 56, 1734 (1990)] 以及 Schildkraut 独立的 [Appl. 56, 1734 (1990)]选择。 29, 2839 (1990)]用于测量极化聚合物薄膜的电光系数，用于测量 z 切割铌酸锂晶体和重氮染料取代的聚合物薄膜的 r33 值。测量的铌酸锂晶体的 r33 值与已知值非常吻合，观测到的极化聚合物薄膜的 r33 值与二次谐波产生测量预测的值非常吻合。
A simple reflection technique proposed by Teng and Man [Appl. Phys. Lett. 56, 1734 (1990)] as well as independently by Schildkraut [Appl. Opt. 29, 2839 (1990)] for measuring the electro‐optic coefficients of poled polymer films is applied to measure the r33 values of both z‐cut lithium niobate crystal and diazo‐dye‐substituted polymer films. The measured r33 value of the lithium niobate crystal is in excellent agreement with the known value, and the observed r33 values of the poled polymer films agree well with those predicted from the second‐harmonic‐generation measurements.