Attractive‐mode atomic force microscopy with optical detection in an orthogonal cantilever/sample configuration
Attractive‐mode atomic force microscopy with optical detection in an orthogonal cantilever/sample configuration
复制标题
在正交悬臂/样品配置中进行光学检测的吸引模式原子力显微镜
DOI：
10.1063/1.351064
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发表时间：
1992
期刊：
影响因子：
--
通讯作者：
M. Vaez
中科院分区：
文献类型：
--
作者：
P. Yang;Y. Chen;M. Vaez
描述了一种吸引模式原子力显微镜，其中悬臂相对于样品正交地保持。该技术利用线性差分光学检测方案来检测悬臂梁振动。在该设计中，悬臂端部不弯曲以形成尖端。这种几何形状大大降低了针尖自发跳到样品上的可能性，允许针尖/样品分离基本上设置为任何期望值。在红细胞涂片成像上呈现了相对较大和较小规模的结果，证明了分辨率和灵敏度。
An attractive‐mode atomic force microscope is described in which the cantilever is held orthogonally with respect to the sample. The technique utilizes a linear differential optical detection scheme for the cantilever vibrations. In this design, the cantilever end is not bent to form a tip. This geometry substantially reduces the possibility of spontaneous jump‐to‐contact of the tip onto the sample, allowing the tip/sample separation to be set essentially to any desired value. Relatively large‐ and small‐scale results are presented on imaging a smear of red blood cells, demonstrating the resolution and sensitivity.