Local-gated single-walled carbon nanotube field effect transistors assembled by AC dielectrophoresis
Local-gated single-walled carbon nanotube field effect transistors assembled by AC dielectrophoresis
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DOI:
10.1088/0957-4484/19/17/175202
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发表时间:
2008-04-30
期刊:
影响因子:
3.5
通讯作者:
Khondaker, Saiful I.
中科院分区:
文献类型:
--
作者:
Stokes, Paul;Khondaker, Saiful I.
We present a simple and scalable technique for the fabrication of solution processed and local-gated carbon nanotube field effect transistors (CNT-FETs). The approach is based on the directed assembly of individual single-walled carbon nanotubes from dichloroethane via AC dielectrophoresis (DEP) onto pre-patterned source and drain electrodes with a local aluminum gate in the middle. Local-gated CNT-FET devices display superior performance compared to a global back gate with on-off ratios > 10(4) and maximum subthreshold swings of 170 mV/dec. The local bottom-gated DEP-assembled CNT-FETs will facilitate large-scale fabrication of complementary metal-oxide-semiconductor (CMOS) compatible nanoelectronic devices.