Thermal conductivity of semiconductor superlattices: Experimental study of interface scattering

Thermal conductivity of semiconductor superlattices: Experimental study of interface scattering
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半导体超晶格的导热性:界面散射的实验研究

DOI:
10.1103/physrevb.79.153304
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发表时间:
2009
期刊:
影响因子:
3.7
通讯作者:
J. Duquesne
J. Duquesne
中科院分区:
物理与天体物理2区
文献类型:
--
作者:
J. Duquesne

文献摘要

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我们提出了在三个短周期 (GaAs)_9(AlAs)_5 超晶格中进行的热导率测量。样品在不同温度下生长,导致不同的小尺度粗糙度和界面变宽。横截面电导率是在室温下用微分 3w 方法测量的。尽管实际变化小于预期,但总体热导率变化的数量级与现有理论模型一致。
We present thermal conductivity measurements performed in three short-period (GaAs)_9(AlAs)_5 superlattices. The samples were grown at different temperatures, leading to different small scale roughness and broadening of the interfaces. The cross-plane conductivity is measured with a differential 3w method, at room temperature. The order of magnitude of the overall thermal conductivity variation is consistent with existing theoretical models, although the actual variation is smaller than expected.