Trace elemental analysis of drugs of abuse using synchrotron radiation total reflection X-ray fluorescence analysis (SR-TXRF).
Trace elemental analysis of drugs of abuse using synchrotron radiation total reflection X-ray fluorescence analysis (SR-TXRF).
复制标题
使用同步辐射全反射 X 射线荧光分析 (SR-TXRF) 对滥用药物进行微量元素分析。
DOI：
10.1520/jfs15500j
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发表时间：
2002
影响因子：
1.6
通讯作者：
J. Matsui
中科院分区：
文献类型：
--
作者：
Seiji Muratsu;T. Ninomiya;Y. Kagoshima;J. Matsui
采用同步辐射全反射x射线荧光光谱法（SR-TXRF）分析了少量滥用药物中的各种微量元素。将含有10微克药物（甲基苯丙胺、安非他明、3,4-亚甲基二氧基甲基苯丙胺、可卡因和海洛因）的1微升溶液样品滴在硅片上进行直接分析。此外，将大麻的传单直接放在硅片上，并将软块形式的鸦片涂抹在另一片硅片上进行分析。在这些实验中，可以检测到约10pg的污染元素。例如，在缴获的甲基苯丙胺样本中发现了碘，这可能是合成途径的指示。在检获的3,4-亚甲基二氧基甲基苯丙胺样本中，发现不同数量的磷、钙、硫和钾，而在对照的3,4-亚甲基二氧基甲基苯丙胺样本中没有检出。对于大麻和鸦片，获得了两种差异较大的光谱模式，可以很容易地进行区分。使用SR-TXRF，可以很容易地检测到10微克各种药物中每种微量元素的pg量，这是标准TXRF实验系统或其他元素分析技术所无法做到的。
Synchrotron radiation total reflection X-ray fluorescence spectroscopy (SR-TXRF) was utilized to analyze various trace elements in small amounts of drugs of abuse. Sample amounts of 1 microL solutions containing 10 microg of drugs (methamphetamine, amphetamine, 3,4-methylenedioxymethamphetamine, cocaine, and heroin) were spotted on silicon wafers for direct analysis. In addition, a leaflet of marijuana was set directly on a silicon wafer, and opium in the form of a soft lump was smeared on another silicon wafer for analysis. In these experiments, about 10 pg of contaminant elements could be detected. For example, in a seized methamphetamine sample, iodine was found, which could be indicative of synthetic route. In seized 3,4-methylenedioxymethamphetamine samples, variable amounts of phosphorus, calcium, sulfur, and potassium were found, which could not be detected in a control 3,4-methylenedioxymethamphetamine sample. For marijuana and opium, two spectral patterns were obtained that were far different from each other and could be easily discriminated. Using SR-TXRF, pg amounts of each trace element in 10 microg of various drugs can be easily detected, which is not the case either for a standard TXRF experimental system or for other elemental analysis techniques.