Ion scattering spectroscopy and scanning tunneling microscopy: A powerful combination for surface structure analysis
Ion scattering spectroscopy and scanning tunneling microscopy: A powerful combination for surface structure analysis
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离子散射光谱和扫描隧道显微镜：表面结构分析的强大组合
DOI：
10.1007/bf00348151
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发表时间：
1991
期刊：
影响因子：
--
通讯作者：
H. Niehus
中科院分区：
文献类型：
--
作者：
H. Niehus
低能离子背散射和扫描隧道显微镜（STM）已被结合使用，以更好地了解表面晶体学领域。这两种方法的互补特性所产生的协同效应已在清洁NiAl（111）和Cu（110）上的氧和氮吸附中得到了例证。原子核的位置可以通过低能惰性气体碰撞离子散射光谱中性检测（NICISS）。作为一种在样品的宏观区域上平均的技术，NICISS更适合于提供关于完全发展的相的特征的信息，无论是在清洁的表面上还是在吸附物饱和的表面上。另一方面，可以通过扫描隧道显微镜（STM）获得额外的信息，STM作为一种强大的局部探针，可以用于以原子分辨率对表面进行成像，并监测缺陷、台阶和生长动力学，例如吸附诱导的相变。
Low-energy ion backscattering and scanning tunneling microscopy (STM) have been used in combination to get better insight into the field of surface crystallography. The synergic effectiveness resulting from the complementing character of the two methods has been exemplified at clean NiAl(111) and for oxygen and nitrogen adsorption on Cu(110). The position of the atom cores is accessible by the low-energy noble gas impact collision ion scattering spectroscopy with neutral detection (NICISS). As a technique averaging over a macroscopic area of the sample, NICISS is better suited to supply information on features of completely developed phases, either on clean or adsorbate saturated surfaces. Additional information, on the other hand, can be gained by scanning tunneling microscopy (STM), which as a powerful local probe may be used to image surfaces with atomic resolution and to monitor defects, steps and the growth kinetics of e.g. adsorption-induced phase changes.