Characterization of controlled microstructures in a γ-TiAl(Cr, Mo, Si, B) alloy
Characterization of controlled microstructures in a γ-TiAl(Cr, Mo, Si, B) alloy
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DOI:
10.1016/s0966-9795(99)00036-9
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发表时间:
1999-10
期刊:
影响因子:
4.4
通讯作者:
D. Zhang;E. Arzt;H. Clemens
中科院分区:
文献类型:
--
作者:
D. Zhang;E. Arzt;H. Clemens