Na and Cs intercalation of 2H-TaSe2 studied by photoemission
Na and Cs intercalation of 2H-TaSe2 studied by photoemission
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DOI：
10.1088/0953-8984/13/44/305
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发表时间：
2001-10
期刊：
影响因子：
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通讯作者：
H. Brauer;H. Starnberg;L. J. Holleboom;H. Hughes;V. Strocov
中科院分区：
文献类型：
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作者：
H. Brauer;H. Starnberg;L. J. Holleboom;H. Hughes;V. Strocov
使用角分辨光发射技术研究了层状化合物 2H-TaSe2 在原位嵌入 Na 和 Cs 前后的电子结构。核心能级光谱证实，Na 和 Cs 在室温下都很容易嵌入，仅少量残留在表面。价带谱揭示了电子能带结构的变化，其范围比刚性能带模型预测的要广泛得多，但与 LAPW 方法计算的理论能带相当一致。实验结果和计算结果之间的一些差异可能是由于插层引起的主层堆叠变化所致。与具有 1T 结构的过渡金属二硫属化物的结果总体相似，表明插层性能并不严重依赖于主体层的内部结构。
The electronic structure of the layered compound 2H-TaSe2 has been studied using angle-resolved photoemission before and after in situ intercalation with Na and Cs. Core level spectra verified that Na and Cs both intercalate easily at room temperature, with only small amounts remaining on the surface. Valence band spectra revealed changes in the electronic band structure which were much more extensive than predicted by the rigid band model, but which were in reasonable agreement with theoretical bands calculated by the LAPW method. Some discrepancies between the experimental and calculated results are probably due to intercalation induced changes in the stacking of host layers. A general similarity with results from transition metal dichalcogenides with 1T structure indicates that the intercalation properties are not critically dependent on the internal structure of the host layers.