Radiation damage to charge coupled devices in the space environment
Radiation damage to charge coupled devices in the space environment
复制标题
空间环境中电荷耦合器件的辐射损伤
DOI：
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发表时间：
1996
期刊：
影响因子：
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通讯作者：
H. Tsunemi
中科院分区：
文献类型：
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作者：
A. Yamashita;T. Dotani;M. Bautz;G. Crew;H. Ezuka;K. Gendreau;T. Kotani;K. Mitsuda;C. Otani;A. Rasmussen;G. Ricker;H. Tsunemi
ASCA 卫星上的固态成像光谱仪 (SIS) 采用了针对软 X 射线检测而优化的电荷耦合器件 (CCD)，自 1993 年发射以来一直在运行。自发射以来的三年多里，我们一直在仔细监测 SIS 由于辐射损坏而导致的性能变化。正如实验室实验所预期的那样，观察到暗电流的增加和电荷转移效率的降低，但它们的特性与发射前的预测有些不同。这是对在太空环境中实际运行的 CCD 的辐射损伤的首次详细分析，并为开发用于太空应用的类似探测器提供了重要信息。
Charge coupled devices (CCDs) optimized for soft X-ray detection were utilized for the solid-state imaging spectrometers (SIS) onboard the ASCA satellite, and have been in operation since its launch in 1993. We have been carefully monitoring the change in performance of SIS due to radiation damage over three years since launch. Both an increase of dark current and a decrease of charge transfer efficiency are observed, as expected from experiments in the laboratory, but their characteristics are somewhat different from those predicted before launch. This is the first detailed analysis of radiation damage to CCDs actually operated in the space environment and gives important information for the development of similar detectors for space applications.