DETECTOR: structural information guided artifact detection for super-resolution fluorescence microscopy image
DETECTOR: structural information guided artifact detection for super-resolution fluorescence microscopy image
复制标题
探测器：超分辨率荧光显微镜图像的结构信息引导伪影检测
DOI：
10.1364/boe.431798
复制
发表时间：
2021-09-01
影响因子：
3.4
通讯作者：
Zhang, Fa
中科院分区：
文献类型：
--
作者：
Gao, Shan;Xu, Fan;Zhang, Fa
超分辨率荧光显微镜具有超过光衍射极限的空间分辨率，已成为在纳米尺度上观察亚细胞结构不可缺少的工具。为了验证超分辨率图像是否反映了样品的底层结构，开发鲁棒可靠的伪影检测方法受到了广泛关注。然而，现有的伪影检测方法由于依赖于宽视场图像与分辨率重新缩放的超分辨率图像之间的绝对强度不匹配，容易报告假警报伪影。为了解决这个问题，我们提出了一种基于结构信息的超分辨率图像伪影检测方法DETECTOR。该方法通过计算宽视场图像与分辨率重新缩放的超分辨率图像之间的结构不相似性来检测伪影。为了提高图像的结构相似性，我们引入了权重掩模来减弱强自身荧光背景的影响，并提出了一种超分辨率图像的结构相似性指标，命名为mask - ssim。仿真和实验结果表明，与现有方法相比，检测器在检测超分辨率图像中的结构伪影方面具有优势。它特别适用于具有强自身荧光背景的宽视场图像和单分子定位显微镜（SMLM）的超分辨率图像。检测器对弱信号区有极高的灵敏度。此外，检测器还可以指导图像重建过程中的数据采集和参数调整。(C) 2021年美国光学学会根据OSA开放获取出版协议的条款
Super-resolution fluorescence microscopy, with a spatial resolution beyond the diffraction limit of light, has become an indispensable tool to observe subcellular structures at a nanoscale level. To verify that the super-resolution images reflect the underlying structures of samples, the development of robust and reliable artifact detection methods has received widespread attention. However, the existing artifact detection methods are prone to report false alert artifacts because it relies on absolute intensity mismatch between the wide-field image and resolution rescaled super-resolution image. To solve this problem, we proposed DETECTOR, a structural information-guided artifact detection method for super-resolution images. It detects artifacts by computing the structural dissimilarity between the wide-field image and the resolution rescaled super-resolution image. To focus on structural similarity, we introduce a weight mask to weaken the influence of strong autofluorescence background and proposed a structural similarity index for super-resolution images, named MASK-SSIM. Simulations and experimental results demonstrated that compared with the state-of-the-art methods, DETECTOR has advantages in detecting structural artifacts in super-resolution images. It is especially suitable for wide-field images with strong autofluorescence background and super-resolution images of single molecule localization microscopy (SMLM). DETECTOR has extreme sensitivity to the weak signal region. Moreover, DETECTOR can guide data collection and parameter tuning during image reconstruction. (C) 2021 Optical Society of America under the terms of the OSA Open Access Publishing Agreement