A compact fluorescence and polarization near-field scanning optical microscope

A compact fluorescence and polarization near-field scanning optical microscope
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紧凑型荧光和偏振近场扫描光学显微镜

DOI:
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发表时间:
1998
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通讯作者:
R. Kopelman
R. Kopelman
中科院分区:
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文献类型:
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作者:
G. Merritt;E. Monson;E. Betzig;R. Kopelman

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我们提出了一个透射,荧光和偏振近场扫描光学显微镜与剪切力反馈控制,是在体积小,操作简单。这款显微镜采用超细机械针尖/样品方法,可在几毫米范围内进行连续手动亚微米控制。压电驱动的12 μm x-y扫描范围由每个方向上的4 mm粗机械平移范围补充。机械反馈回路中使用的结构材料经过精心选择,以确保热兼容性,从而减少尖端和样品之间的膨胀和收缩差异。独特的压合式样品架可实现快速可靠的样品更换。剪切力反馈光通过光纤传送到扫描头,使得任何类型的远程激光器可以用作源。该抖动光被准直并重新聚焦到针尖上,从而提供由高数值孔径物镜收集的一致的小光斑。
We present a transmission, fluorescence, and polarization near-field scanning optical microscope with shear-force feedback control that is small in size and simple to operate. This microscope features an ultrafine mechanical tip/sample approach with continuous manual submicron control over a range of several millimeters. The piezo-driven 12 μm x-y scan range is complimented by a 4 mm coarse mechanical translation range in each direction. The construction materials used in the mechanical feedback loop have been carefully chosen for thermal compatibility in order to reduce differential expansion and contraction between the tip and sample. A unique pressure-fit sample mount allows for quick and reliable sample exchange. Shear-force feedback light is delivered to the scan head via an optical fiber so that a remote laser of any type may be used as a source. This dither light is collimated and refocused onto the tip, delivering a consistently small spot which is collected by a high numerical aperture objective....