INTERFERENCE OF THREE ELECTRON WAVES BY TWO BIPRISMS AND ITS APPLICATION TO DIRECT VISUALIZATION OF ELECTROMAGNETIC FIELDS IN SMALL REGIONS
INTERFERENCE OF THREE ELECTRON WAVES BY TWO BIPRISMS AND ITS APPLICATION TO DIRECT VISUALIZATION OF ELECTROMAGNETIC FIELDS IN SMALL REGIONS
复制标题
两个双棱镜对三电子波的干涉及其在小区域电磁场直接可视化中的应用
DOI:
10.1063/1.365610
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发表时间:
1997
影响因子:
3.2
通讯作者:
A. Tonomura
中科院分区:
文献类型:
--
作者:
T. Hirayama;G. Lai;T. Tanji;N. Tanaka;A. Tonomura
We present a method for the interference of three electron waves and its application to direct visualization of pure phase objects such as electromagnetic microfields. Using a transmission electron microscope equipped with a field-emission electron gun and two electron biprisms, an object wave and two reference waves at either side of the object wave are superposed to produce a new type of interference pattern. In this pattern, equal-phase lines of the object wave are directly displayed as intensity modulation of periodic interference fringes. An electric field around a latex particle, induced by electron-beam irradiation, has been observed. The electric charge of the particle is estimated, from observed phase shift, to be 6.4×10−17 C, which is equal to about 400 electrons. A change of the electric field around charged alumina particles at high temperatures has been observed dynamically. Magnetic flux lines emerging from a barium ferrite particle are also visualized.