Temperature study of Al0.52In0.48P detector photon counting X-ray spectrometer
Temperature study of Al0.52In0.48P detector photon counting X-ray spectrometer
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DOI：
10.1063/1.4966940
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发表时间：
2016-11
影响因子：
3.2
通讯作者：
S. Butera;T. Gohil;G. Lioliou;A. Krysa;A. M. Barnett
中科院分区：
文献类型：
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作者：
S. Butera;T. Gohil;G. Lioliou;A. Krysa;A. M. Barnett
为研制耐温光子计数X射线光谱仪，在100 °C至−20 °C温度范围内对直径为200 μm的Al0.52In0.48P p+-i-n+梅萨光电二极管（2 μm i层）进行了表征。在每个温度下，用在0 V、5V、10 V和15 V下反向偏置的AlInP检测器并使用不同的成形时间来累积X射线光谱。探测器由55 Fe放射性同位素X射线源照射。在所有研究温度下，在15 V下观察到最佳能量分辨率（由5.9 keV下的半峰全宽（FWHM）量化）;在100 °C下，FWHM为1.57 keV，在−20 °C下，该值提高到770 eV FWHM。还进行了系统噪声分析，并计算了不同的噪声贡献作为温度的函数。这些结果首次证明了AlInP在20 °C以外的温度下适用于光子计数X射线光谱学。
A prototype 200 μm diameter Al0.52In0.48P p+-i-n+ mesa photodiode (2 μm i-layer) was characterised at temperatures from 100 °C to −20 °C for the development of a temperature tolerant photon counting X-ray spectrometer. At each temperature, X-ray spectra were accumulated with the AlInP detector reverse biased at 0 V, 5 V, 10 V, and 15 V and using different shaping times. The detector was illuminated by an 55Fe radioisotope X-ray source. The best energy resolution, as quantified by the full width at half maximum (FWHM) at 5.9 keV, was observed at 15 V for all the temperatures studied; at 100 °C, a FWHM of 1.57 keV was achieved, and this value improved to 770 eV FWHM at −20 °C. System noise analysis was also carried out, and the different noise contributions were computed as functions of temperature. The results are the first demonstration of AlInP's suitability for photon counting X-ray spectroscopy at temperatures other than ≈20 °C.