A Computational Study of Monolayer 2H WTe2 - Metal Interfaces
A Computational Study of Monolayer 2H WTe2 - Metal Interfaces
复制标题
单层 2H WTe2 - 金属界面的计算研究
DOI:
10.1002/pssb.201600837
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发表时间:
2017
期刊:
影响因子:
--
通讯作者:
Jing Lu
中科院分区:
文献类型:
--
作者:
Chol So;Han Zhang;Yangyang Wang;Meng Ye;Yuanyuan Pan;Jing Lu
Monolayer (ML) hexagonal (2H) WTe2is predicted to be the best channel material of tunnel field effect transistor (TFET) and metal–oxide–semiconductor field effect transistor (MOSFET) among ML transition‐metal dichalcogenides. Actual devices based on 2H WTe2typically have a contact with metal. We explore for the first time the interfacial properties between ML 2H WTe2and Sc, Ti, Pd, Pt, Ag, and Au by usingab initioelectronic structure calculation andab initioquantum transport simulations. The energy bands of ML 2H WTe2on Sc, Ti, Pd, and Pt substrates are destroyed strongly due to strong adhesion of ML 2H WTe2with metal substrates, and ML 2H WTe2–Sc, −Ti, −Pd, and −Pt systems are regarded as new metallic materials. Weak adhesion is formed between ML 2H WTe2and the Ag and Au surfaces, with the electronic energy band of ML 2H WTe2being identifiable. Ag and Au formn‐type Schottky contact with ML 2H WTe2at the vertical direction with electron Schottky barrier height (SBH) of 0.24 and 0.49 eV, respectively. In contrast, Pd, Pt, and Ti formp‐type Schottky contact with ML 2H WTe2in the lateral direction with hole SBH of 0.26, 0.40, and 0.63 eV, respectively. Our study not only presents a theoretical insight into the ML 2H WTe2–metal interfaces but also help in ML 2H WTe2based device design.