Interaction force between thin film disk media and elastic solids investigated by atomic force microscope
Interaction force between thin film disk media and elastic solids investigated by atomic force microscope
复制标题
用原子力显微镜研究薄膜磁盘介质与弹性固体之间的相互作用力
DOI：
10.1115/1.2920294
复制
发表时间：
1990
影响因子：
2.5
通讯作者：
Y. Ando
中科院分区：
文献类型：
--
作者：
T. Miyamoto;R. Kaneko;Y. Ando
利用原子力显微镜研究了不同弹性固体尖端与四种不同样品之间的相互作用力。样品为：涂覆有具有二醇端基的功能性液体润滑剂的薄膜盘介质、未润滑的盘介质、单晶硅晶片和蒸发到单晶硅上的Au。本文研究了磁盘介质与锥形平板磁头滑块之间的相互作用与静摩擦力之间的关系。涂有厚度大于11.0nm的功能液体润滑剂的磁盘介质与半径为5 μm-100 μm的钨针尖之间的相互作用力是由功能液体润滑剂弯月面引起的
Atomic force microscopy is used to investigate the interaction force between the sharp tips of various elastic solids and four different samples. The samples are: thin film disk media coated with functional liquid lubricant having diol end groups, unlubricated disk media, a single-crystal silicon wafer, and Au evaporated onto single-crystal silicon. Relationships between the interaction and static friction force of disk media and a taper flat type head slider are examined. The interaction force between a disk medium coated with a functional liquid lubricant greater than 11.0 nm thick and tungsten tips with radii of 5 μm-100 μm is caused by the functional liquid lubricant meniscus