Submicron Raman spectroscopy mapping of serpentinite fault rocks
Submicron Raman spectroscopy mapping of serpentinite fault rocks
复制标题
蛇纹岩断层岩的亚微米拉曼光谱图
DOI：
10.1002/jrs.5277
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发表时间：
2018
影响因子：
2.5
通讯作者：
K. Gordon
中科院分区：
文献类型：
--
作者：
J. Rooney;M. Tarling;Steven A. Smith;K. Gordon
亚微米拉曼光谱映射能够明确区分主要的蛇纹石矿物在其原位显微结构的背景。高空间分辨率（~370 nm）、大面积覆盖（每个维度上可达数百微米）以及直接在抛光薄片上绘图的能力，使人们能够对蛇纹岩断层岩结构的性质和演化做出新的解释。通过检查鳞片蛇纹岩的亚微米尺度纹理（例如，溶解缝，压力阴影中的矿物生长，分布和蛇纹石矿物的共生），来自新西兰岩石圈规模的剪切带和美国加州与俯冲有关的蛇纹岩体。
Submicron Raman spectroscopy mapping is able to unambiguously distinguish the main serpentine minerals within their in situ microstructural context. The high spatial resolution (~370 nm), large‐area coverage (up to hundreds of micrometres in each dimension), and ability to map directly on polished thin sections allows novel interpretations to be made regarding the nature and evolution of serpentinite fault rock textures. The potential of this method is illustrated by examining submicron‐scale textures of scaly serpentinites (e.g., dissolution seams, mineral growth in pressure shadows, distribution, and intergrowth of serpentine minerals) from a lithospheric‐scale shear zone in New Zealand and a subduction‐related serpentinite body in California, USA.