More features, more tools, more CrysTBox
More features, more tools, more CrysTBox
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DOI：
10.1107/s1600576717006793
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发表时间：
2017-08-01
影响因子：
6.1
通讯作者：
Klinger, Miloslav
中科院分区：
文献类型：
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作者：
Klinger, Miloslav
推出新版本的 CrysTBox 软件。原始工具箱可以自动分析透射电子显微镜 (TEM) 图像并进行晶体学可视化。现有工具能够对高分辨率 TEM 图像以及点、盘和环衍射图案进行高精度分析，并经过扩展，包括使用两束近似中的会聚束电子衍射自动测量 TEM 样品厚度的工具。新推出了几何相分析的实现，它采用现有工具之一来识别输入图像中描绘的晶面参数和指数，并允许更轻松、更准确的分析。晶体学可视化功能也得到扩展。除了模拟衍射图案和原子结构外，还新提供了球极投影和反极图工具。还引入了一种能够可视化两个不同相的原子结构及其界面的新工具。
A new release of the CrysTBox software is introduced. The original toolbox allows for an automated analysis of transmission electron microscope (TEM) images and for crystallographic visualization. The existing tools, which are capable of highly precise analyses of high-resolution TEM images, as well as spot, disc and ring diffraction patterns, are extended to include a tool for automatically measuring TEM sample thickness using convergent beam electron diffraction in a two-beam approximation. An implementation of geometric phase analysis is newly available, employing one of the existing tools to identify parameters and indices of crystallographic planes depicted in the input image and allowing easier and more accurate analysis. The crystallographic visualization capabilities are extended as well. Along with the simulated diffraction pattern and atomic structure, a stereographic projection and inverse pole figure tool is newly offered. A new tool able to visualize the atomic structure of two different phases and their interface is also introduced.