Use of simultaneous reflections for precise absolute energy calibration of x rays
Use of simultaneous reflections for precise absolute energy calibration of x rays
复制标题
使用同时反射进行 X 射线的精确绝对能量校准
DOI：
10.1063/1.1140826
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发表时间：
1989
影响因子：
1.6
通讯作者：
J. Arthur
中科院分区：
文献类型：
--
作者：
J. Arthur
对硅单色晶体中同时反射引起的同步加速器X射线束强度变化的实验研究与基于动态衍射理论的计算进行了比较，以确定使用这种强度变化进行能量校准的实际限制。已经发现，单色晶体的相对未对准可导致约0.01%的误差（在10 keV下为1 eV），但是在短测量中可以实现在0.002%（在10 keV下为0.2 eV）内的能量校准。
An experimental study of intensity variations in a synchrotron x‐ray beam caused by the presence of simultaneous reflections in the silicon monochromator crystals has been compared with calculations based on dynamical diffraction theory in an effort to determine the practical limits to the use of such intensity variations for energy calibration. It has been found that relative misalignments of the monochromator crystals can lead to errors of approximately 0.01% (1 eV at 10 keV), but that with some care energy calibration to within 0.002% (0.2 eV at 10 keV) can be achieved in a short measurement.