d -Band Hole Dynamics in Gold Nanoparticles Measured with Time-Resolved Emission Upconversion Microscopy

d -Band Hole Dynamics in Gold Nanoparticles Measured with Time-Resolved Emission Upconversion Microscopy
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使用时间分辨发射上转换显微镜测量金纳米颗粒中的 d 带空穴动力学

DOI:
10.1021/acs.nanolett.3c00622
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发表时间:
2023
期刊:
影响因子:
10.8
通讯作者:
Link, Stephan
Link, Stephan
中科院分区:
材料科学1区
文献类型:
--
作者:
Lee, Stephen A.;Kuhs, Christopher T.;Searles, Emily K.;Everitt, Henry O.;Landes, Christy F.;Link, Stephan

文献摘要

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等离子体衰变产生的含能载流子可以提高光催化剂和光伏器件的性能,而这些含能载流子的寿命对整体效率有很大影响。虽然等离子体金纳米粒子中的热电子寿命已经被研究过,但在等离子体系统中热空穴寿命还没有得到彻底的研究。在这里,我们展示了时间分辨发射上转换显微镜,并用它来解决金纳米粒子中d带空穴的寿命和能量依赖的冷却问题,这些空穴是由等离子体激元激发并伴随着等离子体衰变进入带间,然后是带内电子-空穴对而形成的。
The performance of photocatalysts and photovoltaic devices can be enhanced by energetic charge carriers produced from plasmon decay, and the lifetime of these energetic carriers greatly affects overall efficiencies. Although hot electron lifetimes in plasmonic gold nanoparticles have been investigated, hot hole lifetimes have not been as thoroughly studied in plasmonic systems. Here, we demonstrate time-resolved emission upconversion microscopy and use it to resolve the lifetime and energy-dependent cooling ofd-band holes formed in gold nanoparticles by plasmon excitation and by following plasmon decay into interband and then intraband electron–hole pairs.