Interferometry of a single nanoparticle using the Gouy phase of a focused laser beam
Interferometry of a single nanoparticle using the Gouy phase of a focused laser beam
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DOI：
10.1016/j.optcom.2007.08.032
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发表时间：
2007-12-15
影响因子：
2.4
通讯作者：
Moerner, W. E.
中科院分区：
文献类型：
--
作者：
Hwang, Jaesuk;Moerner, W. E.
我们对聚焦高斯激光束中的纳米粒子引起的远场强度调制的机制进行了定量解释，正如最近的几项直接检测研究所证明的那样。大多数方法利用入射光和来自纳米颗粒的散射光之间的干涉来促进信号对纳米颗粒体积的线性依赖性。纳米颗粒的入射场和散射场之间的相位关系通过古伊相的概念来阐明。这种相位关系用于分析远场信噪比，作为纳米颗粒相对于光束焦点的精确位置的函数。计算表明，纯色散纳米颗粒应该从高斯光束焦点移开，以产生远场强度变化。 (C) 2007 Elsevier B.V. 保留所有权利。
We provide a quantitative explanation of the mechanism of the far-field intensity modulation induced by a nanoparticle in a focused Gaussian laser beam, as was demonstrated in several recent direct detection studies. Most approaches take advantage of interference between the incident light and the scattered light from a nanoparticle to facilitate a linear dependence of the signal on the nanoparticle volume. The phase relation between the incoming field and the scattered field by the nanoparticle is elucidated by the concept of Gouy phase. This phase relation is used to analyze the far-field signal-to-noise ratio as a function of exact nanoparticle position with respect to the beam focus. The calculation suggests that a purely dispersive nanoparticle should be displaced from the Gaussian beam focus to generate a far-field intensity change. (C) 2007 Elsevier B.V. All rights reserved.