Analysis of cell-aware test pattern effectiveness — A case study using a 32-bit automotive microcontroller
Analysis of cell-aware test pattern effectiveness — A case study using a 32-bit automotive microcontroller
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细胞感知测试模式有效性分析 - 使用 32 位汽车微控制器的案例研究
DOI：
10.1109/ets.2014.6847826
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发表时间：
2014
期刊：
影响因子：
--
通讯作者：
Thomas Schumann
中科院分区：
文献类型：
--
作者：
A. Prabhu;Vlado Vorisek;H. Lang;Thomas Schumann
随着半导体制造的发展，趋势趋于深度次级微米技术，从而使摩尔定律成为现实，节点尺寸的减少引入了制造中的新缺陷机制，尤其是与汽车行业有关的严格质量要求。相同的传统故障模型（如Stick-at和过渡延迟模型）已用于芯片设计的数字逻辑在本文中，在使用MentorGraphics®引入的新细胞意识模型中，在制造缺陷中，正在使用Freescale™进行使用 - 在CMOS 55NM工艺技术中生产的ART微控制器产品，对故障模型进行了测试覆盖范围和测试成本（模式计数），并与Freescale使用的传统故障模型进行了比较分析是通过执行多个实验进行的，尤其是专注于减少测试模式计数开销。
With the semiconductor manufacturing development following the trend into very-deep sub-micron technologies and thus making Moore's law a reality, the decrease in node size introduces new defect mechanisms in manufacturing. Still, the strict quality requirements especially related to the automotive industry stay the same. Traditional fault models like stuck-at and transition delay models which have been used for the digital logic of System-on-Chip designs may be successful in detecting most of the manufacturing defects, but not all of them. In this paper, the new Cell Aware fault model, which has been introduced by Mentor Graphics®, is being evaluated for usage in the automotive design process of Freescale™. Using a state-of-the-art microcontroller product manufactured in a CMOS 55nm process technology, the fault model is evaluated for test coverage and test cost (pattern count) and compared against the traditional fault models used by Freescale. The analysis is carried out by performing several experiments, especially focusing on reducing the test pattern count overhead.