Size-dependent melting point depression of nanostructures: Nanocalorimetric measurements
Size-dependent melting point depression of nanostructures: Nanocalorimetric measurements
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DOI：
10.1103/physrevb.62.10548
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发表时间：
2000-10
影响因子：
3.7
通讯作者：
Ming Zhang;M. Efremov;F. Schiettekatte;E. Olson;A. T. Kwan;S. Lai;T. Wisleder;J. Greene;L. A
中科院分区：
文献类型：
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作者：
Ming Zhang;M. Efremov;F. Schiettekatte;E. Olson;A. T. Kwan;S. Lai;T. Wisleder;J. Greene;L. A
采用超灵敏薄膜扫描量热技术研究了非晶氮化硅上蒸发形成的 0.1\char21{}10 nm 厚不连续铟薄膜的熔化行为。这些薄膜由纳米结构的集合组成，其熔化温度和熔化潜热的尺寸依赖性被确定。通过将量热测量值与透射电子显微镜获得的粒度分布进行比较，仅从实验结果（即没有假设模型）推导出纳米结构半径与相应熔点和潜热之间的关系。结果表明，对于半径为 2 nm 的颗粒，所研究的铟纳米结构的熔点降低了 110 K。实验结果根据现有的熔点降低模型进行了讨论。观察到与均匀熔化模型非常一致。
The melting behavior of 0.1\char21{}10-nm-thick discontinuous indium films formed by evaporation on amorphous silicon nitride is investigated by an ultrasensitive thin-film scanning calorimetry technique. The films consist of ensembles of nanostructures for which the size dependence of the melting temperature and latent heat of fusion are determined. The relationship between the nanostructure radius and the corresponding melting point and latent heat is deduced solely from experimental results (i.e., with no assumed model) by comparing the calorimetric measurements to the particle size distributions obtained by transmission electron microscopy. It is shown that the melting point of the investigated indium nanostructures decreases as much as 110 K for particles with a radius of 2 nm. The experimental results are discussed in terms of existing melting point depression models. Excellent agreement with the homogeneous melting model is observed.