Use of dynamic light scattering to determine second virial coefficient in a semidilute concentration regime
Use of dynamic light scattering to determine second virial coefficient in a semidilute concentration regime
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DOI：
10.1016/j.ab.2010.12.014
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发表时间：
2011-04-15
影响因子：
2.9
通讯作者：
Kalonia, Devendra S.
中科院分区：
文献类型：
--
作者：
Yadav, Sandeep;Scherer, Thomas M.;Kalonia, Devendra S.
本工作讨论了从动态光散射(DLS)仪器获得稀薄和半稀薄浓度区域中静态光散射(SLS)参数的替代方法，该仪器使用雪崩光电二极管(APD)来记录散射强度信号。雪崩探测器使人们能够分别通过光子计数和光子相关来执行SLS和DLS测量。然而，由于相关的恢复时间，APD很容易受到饱和(高于1000kcps)的影响，这可能会限制散射过多光的系统的测量。我们提出了另一种获得SLS参数的方法，该方法是用雪崩光电二极管记录信号强度。(C)2010 Elsevier Inc.保留所有权利。
The present work discusses an alternative procedure to obtain static light scattering (SLS) parameters in a dilute and semidilute concentration regime from a dynamic light scattering (DLS) instrument that uses an avalanche photodiode (APD) for recording the scattered intensity signal. An APD enables one to perform both SLS and DLS measurements by photon counting and photon correlation, respectively. However, due to the associated recovery time, the APDs are susceptible to saturation (above 1000 kcps), which may limit the measurements in systems that scatter too much light. We propose an alternative way of obtaining the SLS parameters with instruments that use APD for recording signal intensities. (C) 2010 Elsevier Inc. All rights reserved.