Determination of crystallographic chirality of MnSi thin film grown on Si (111) substrate

Determination of crystallographic chirality of MnSi thin film grown on Si (111) substrate
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DOI:
10.1103/physrevmaterials.4.014407
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发表时间:
2020-01-21
影响因子:
3.4
通讯作者:
Arima, Taka-hisa
Arima, Taka-hisa
中科院分区:
材料科学3区
文献类型:
--
作者:
Morikawa, Daisuke;Yamasaki, Yuichi;Arima, Taka-hisa

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MnSi是一种典型的手性立方磁体,其中出现了被称为磁skyrmions的旋转磁性物体。预期MnSi薄膜可扩大温度-磁场图中的磁性skyrmion晶格相的范围。另一方面,在非手性Si(111)衬底上的MnSi膜可能遭受手性孪晶形成。我们成功地可视化的领域结构的手性和轴取向的MnSi薄膜通过使用透射电子显微镜和X射线反射率测量的组合。在Si(111)衬底上只发现了两种畴。这些信息对于同手性薄膜制造的挑战至关重要。
MnSi is a prototypical chiral cubic magnet, in which swirling magnetic objects referred to as magnetic skyrmions appear. It is expected that the thin film of MnSi may expand the range of the magnetic skyrmion lattice phase in the temperature-magnetic field diagram. On the other hand, the MnSi film on an achiral Si (111) substrate may suffer from chiral twin formation. We succeeded in visualizing the domain structure of the chirality and axis orientation of a MnSi thin film by using a combination of transmission electron microscopy and x-ray reflectivity measurement. Only two types of domains were found on a Si (111) substrate. The information is essential for the challenge of homochiral film fabrication.