Growth of self-assembled monolayer on tetrahedral amorphous carbon film coated magnetic head
Growth of self-assembled monolayer on tetrahedral amorphous carbon film coated magnetic head
复制标题
四面体非晶碳膜磁头上自组装单分子层的生长
DOI：
10.1016/j.surfcoat.2007.12.018
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发表时间：
2008
影响因子：
5.4
通讯作者：
Jiecai Han
中科院分区：
文献类型：
--
作者：
Hua‐Yu Zhang;M. Tan;Zhenye Zhu;Y. Wang;Hongtao Ma;Jiecai Han
用1H、1H、2H、2H-全氟十二烷基三氯硅烷(FDTS)为溶剂，在不同的浸渍时间下，对涂覆有四面体非晶碳(ta-C)薄膜的磁头进行了浸渍处理。飞行时间二次离子质谱仪证实了FDTS自组装单分子膜(SAM)在TA-C表面的生长。在生长过程中观察到了四个不同的阶段：(1)低覆盖度(成核)，(2)长大，(3)合并和(4)完全单层，类似于低温外延薄膜生长的理论模型。用去离子水测量了FDTS单分子膜生长过程中接触角随时间的变化规律。用原子力显微镜(AFM)测定了FDTS单分子膜的表面形貌、轮廓和粗糙度(RMS)。此外，透射电子显微镜还揭示了单层厚度和分布的变化，这与原子力显微镜和接触角的结果是一致的。
The magnetic heads overcoated by tetrahedral amorphous carbon (ta-C) films have been immersed in the 1H, 1H, 2H, 2H-perfluorodecyltrichlorosilane (FDTS) solvent at different predetermined dipping time. The growth of FDTS self-assembled monolayer (SAM) on the ta-C surface has been confirmed by time-of-flight secondary ion mass spectrometry. Four distinct stages were observed in the growing process: (1) low coverage (nucleation), (2) growing up (3) coalescence and (4) complete monolayer, similar to the theoretical models of epitaxial film growth at low temperatures. Contact angle measurement using de-ionized water is carried out to study the time dependence of contact angle during the growth process of FDTS monolayer. The surface morphology, profiles and roughness (rms) of FDTS monolayer were determined by atomic force microscopy (AFM). Furthermore, the variation of monolayer thickness and distribution was revealed by transmission electron microscopy, which is in agreement with the AFM and contact angle results.