HIGHER SMECTIC-LAYER ORDER PARAMETERS IN LIQUID-CRYSTALS DETERMINED BY X-RAY-DIFFRACTION AND THE EFFECT OF ANTIFERROELECTRICITY
HIGHER SMECTIC-LAYER ORDER PARAMETERS IN LIQUID-CRYSTALS DETERMINED BY X-RAY-DIFFRACTION AND THE EFFECT OF ANTIFERROELECTRICITY
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DOI：
10.1103/physreve.51.400
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发表时间：
1995-01-01
影响因子：
2.4
通讯作者：
FUKUDA, A
中科院分区：
文献类型：
--
作者：
TAKANISHI, Y;IKEDA, A;FUKUDA, A
通过观察与层间距对应的高阶布拉格峰，得到了近晶层至三阶的有序参数，并计算了质心沿层法线的分布函数沿着.结果清楚地表明，反铁电液晶中的近晶层分布不同于正弦密度波，反铁电Sm-C A（*）中的近晶（Sm）层序比铁电Sm-C（*）中的近晶层序高。稳定的反铁电性与高的近晶层有序度有关。
By observing the higher-order Bragg peaks corresponding to the layer spacing, the smectic-layer order parameters up to the third order were obtained and the center-of-mass distribution function along the layer normal was calculated. The results clearly indicate that the smectic layer distribution is different from a sinusoidal density wave in antiferroelectric liquid crystals and that the smectic-(Sm) layer order is relatively higher in antiferroelectric Sm-C A (*) than in ferroelectric Sm-C (*). There exists a correlation between the stable antiferroelectricity and the higher smectic-layer order.