Preparation of epitaxial BiFeO3 thin films on La-SrTiO3 substrate by using magnetic-field-assisted pulsed laser deposition

Preparation of epitaxial BiFeO3 thin films on La-SrTiO3 substrate by using magnetic-field-assisted pulsed laser deposition
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DOI:
10.3938/jkps.62.1041
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发表时间:
2013-04
影响因子:
0.6
通讯作者:
J. Park;M. Sohgawa;T. Kanashima;M. Okuyama;S. Nakashima
J. Park;M. Sohgawa;T. Kanashima;M. Okuyama;S. Nakashima
中科院分区:
物理与天体物理4区
文献类型:
--
作者:
J. Park;M. Sohgawa;T. Kanashima;M. Okuyama;S. Nakashima

文献摘要

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通过使用磁场辅助脉冲激光沉积,在 La 掺杂 (001) SrTiO3 基底 (La-STO) 上制备了外延 BiFeO3 (BFO) 薄膜。在0、0.1和0.4 T磁场下制备的外延BFO薄膜的X射线衍射图仅显示(00ℓ)衍射峰,没有第二相。从所有外延BFO薄膜的倒易空间映射结果来看,(003)反射显示出分裂点,(-103)和(103)反射的不对称点显示出菱面体结构。通过磁场强度改变外延薄膜的微观结构,在0.4 T磁场的高沉积速率下制备的薄膜呈现出柱状结构。所有外延薄膜在室温(RT)下获得了极化与电场的磁滞回线;特别是,在0.1T磁场下制备的外延膜在室温下的剩余极化为46μC/cm2,同时与其他外延膜相比电流密度降低。
Epitaxial BiFeO3 (BFO) thin films have been prepared on La-doped (001) SrTiO3 substrates (La-STO) by using magnetic-field-assisted pulsed laser deposition. X-ray diffraction patterns of the epitaxial BFO thin films prepared under magnetic fields of 0, 0.1, and 0.4 T show only (00ℓ) diffraction peaks without secondary phases. From the results of reciprocal space mapping for all epitaxial BFO thin films, (003) reflections show splitting spots, and asymmetric spots of (−103) and (103) reflections exhibit a rhombohedral structure. The microstructure of the epitaxial thin films was modified by the strength of magnetic field, and a columnar structure was shown in the film prepared under a high deposition rate for a magnetic field of 0.4 T. The polarization versus electric field hysteresis loops were obtained at room temperature (RT) in all the epitaxial films; in particular, the remanent polarization for the epitaxial film prepared under a magnetic field of 0.1 T was 46 µC/cm2 at RT while the current density was reduced in comparison with those of other epitaxial films.