Phase retrieval microscopy for quantitative phase-contrast imaging
Phase retrieval microscopy for quantitative phase-contrast imaging
复制标题
DOI:
10.1078/0030-4026-00336
复制
发表时间:
2004-01-01
期刊:
影响因子:
3.1
通讯作者:
Tiziani, HJ
中科院分区:
文献类型:
--
作者:
Zhang, Y;Pedrini, G;Tiziani, HJ
We present an approach for quantitative phase contrast imaging and optical metrology. This technique uses a CCD for in-line hologram recording and the phase retrieval algorithm for hologram reconstruction. The obtained phase distribution is equal, module 2pi, to the phase distribution of the surface of the object. An application to surface profilometry is presented and good measurement result has been achieved.