X-ray topographic and optical imaging studies of synthetic diamonds
X-ray topographic and optical imaging studies of synthetic diamonds
复制标题
合成钻石的 X 射线形貌和光学成像研究
DOI：
10.1107/s0021889894006734
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发表时间：
1994
影响因子：
6.1
通讯作者：
A. R. Lang
中科院分区：
文献类型：
--
作者：
A. R. Lang
研究了用重构法生长的大的人造金刚石，它们都表现出{100}、{111}、{110}和{113}的生长形式。采用常规的Cu Kα1射线源，采用截面、投影和有限投影形貌技术，通过X射线形貌术对晶体完整性进行了评价。对于增长部门配置的映射，阴极发光形貌，双折射显微镜和着色映射也被采用。详细介绍了对三颗钻石的观察。每个样本都有一对平行的机械抛光表面，其方向分别为±（100）、±（111）和±（110）。三个样本的总体宽度和厚度如下：±（100）面，3.2和0.76 mm; ±（111）面，2.5和0.92 mm; ±（110）面，5和0.7 mm。 位错密度和轨迹，以及个别位错图像的宽度和对比度，进行了描述。研究了双折射显微照片和X射线形貌照片中位错图像的可见性随线取向的变化。讨论的其他主题包括结构和对比度的X射线地形图像的生长部门的边界和精细结构的图像中的小夹杂物和表面压痕。
Large synthetic diamonds grown by the reconstitution method, all exhibiting the growth forms {100}, {111}, {110} and {113}, were studied. Crystal perfection was assessed by X-ray topography using a conventional source of Cu Kα1 radiation and employing the section, projection and limited-projection topographic techniques. For the mapping of growth-sector configurations, cathodoluminescence topography, birefringence micrography and colouration mapping were also employed. Observations on three diamonds are detailed. Each specimen possessed a parallel pair of mechanically polished surfaces, which had orientations ±(100), ±(111) and ±(110), respectively. The overall widths and thicknesses of the three specimens were as follows: the ±(100) faceted, 3.2 and 0.76 mm; the ±(111) faceted, 2.5 and 0.92 mm; the ±(110) faceted, 5 and 0.7 mm. Dislocation densities and trajectories, and the widths and contrast of individual dislocation images, are described. The variation of visibility of dislocation images in birefringence micrographs and in X-ray topographs as a function of line orientation was investigated. Other topics discussed include structure and contrast in X-ray topographic images of growth-sector boundaries and fine structure in images of small inclusions and surface indentations.