Direct‐view microscopy: optical sectioning strength for finite‐sized, multiple‐pinhole arrays

Direct‐view microscopy: optical sectioning strength for finite‐sized, multiple‐pinhole arrays
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直视显微镜:有限尺寸、多针孔阵列的光学切片强度

DOI:
10.1111/j.1365-2818.1996.tb00004.x
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发表时间:
1996
影响因子:
2
通讯作者:
John Hegarty
John Hegarty
中科院分区:
工程技术4区
文献类型:
--
作者:
E. Mccabe;D. T. Fewer;A. Ottewill;S. Hewlett;John Hegarty

文献摘要

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直视显微镜在光源和探测器平面上使用多孔阵列。我们发展了一种用于明场和荧光直视显微镜的理论,它允许我们确定具有任意孔径分布的有限大小的多针孔阵列的光学截面强度。我们专门研究了正方形、六角形和交错阿基米德螺旋阵列的情况,并考虑了阵列配置对光学分割强度和光预算的影响。
Direct‐view microscopes use multiple‐aperture arrays in the source and detector planes. We develop a theory for brightfleld and fluorescence direct‐view microscopy which allows us to determine the optical sectioning strength for finite‐sized, multiple‐pinhole arrays with an arbitrary distribution of apertures. We specialize to the cases of square, hexagonal and interleaving Archimedean spiral arrays and consider the implications of the array configuration on both the optical sectioning strength and the light budget.