A novel method for determination of dielectric properties of materials using a combined embedded modulated scattering and near-field microwave techniques - Part 1: Forward model
A novel method for determination of dielectric properties of materials using a combined embedded modulated scattering and near-field microwave techniques - Part 1: Forward model
复制标题
DOI：
10.1109/tim.2005.858132
复制
发表时间：
2005-12-01
影响因子：
5.6
通讯作者：
Zoughi, R
中科院分区：
文献类型：
--
作者：
Hughes, D;Zoughi, R
将嵌入式调制散射技术与近场微波无损检测技术相结合，是一种评价材料介电性能的新方法。用于确定辐射到电介质半空间中的波导的孔径处的反射系数的正演公式，其中PIN二极管加载的偶极子（即，调制散射技术探头）的嵌入。该公式基于计算波导和偶极子之间的近场耦合作为互阻抗。
The use of combined embedded modulated scattering technique and near-field microwave nondestructive testing techniques is investigated as a novel method for evaluating the dielectric properties of a material. The forward formulation for determining the reflection coefficient at the aperture of a waveguide radiating into a dielectric half-space in which a PIN diode-loaded dipole (i.e., modulated scattering technique probe) is embedded is presented. This formulation is based upon calculating the near-field coupling between the waveguide and the dipole as a mutual impedance.