Characteristic X-ray Production in Thin Crystals
Characteristic X-ray Production in Thin Crystals
复制标题
薄晶体中特征 X 射线的产生
DOI：
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发表时间：
1973
期刊：
影响因子：
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通讯作者：
Saffron Waiden
中科院分区：
文献类型：
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作者：
M. Jacobs;H. Hall;Saffron Waiden
使用非常薄的外延生长的单晶体的特征X射线生产的电子束取向的依赖关系进行了研究。在厚度约为100 μ m的Ag和Pd晶体中，[111]方向附近的取向发生微小变化时，L壳层产率的变化可超过2倍。理论分析结果表明，不同的布洛赫波不产生独立的X射线，但干涉效应发生。这些意见的意义进行了讨论。
The dependence of the characteristic X-ray production on electron beam orientation is studied using very thin epitaxially grown single crystals. In crystals of Ag and Pd of thickness ~100 Å the L shell yield can change by more than a factor of 2 for small changes in orientation near the [111] direction. Theoretical analysis of the results shows that the different Bloch waves do not produce X-rays independently but that interference effects occur. The significance of these observations is discussed.