Parallel two-step phase-shifting microscopic interferometry based on a cube beamsplitter
Parallel two-step phase-shifting microscopic interferometry based on a cube beamsplitter
复制标题
基于立方体分束器的并行两步相移显微干涉测量
DOI：
10.1016/j.optcom.2011.04.049
复制
发表时间：
2011-08-15
影响因子：
2.4
通讯作者：
Ye, Tong
中科院分区：
文献类型：
--
作者：
Gao, Peng;Yao, Baoli;Ye, Tong
提出了用于显微测量的并行两步相移干涉术，讨论了广义两步相移干涉术的记录条件。45度倾斜立方体分束器能够将正交线偏振的物波和参考波分别复制到两个平行的光束中。在此基础上，得到了沿两束光方向的两幅相移正交的干涉图，并用改进的算法进行了相位重构。为了从两步相移干涉图中重建相位分布，需要满足一定的记录条件。然而，录音条件以前从未被讨论过。本文推导了两步相移干涉术的记录条件，即参照波强度不小于物波强度的两倍。(C)2011爱思唯尔B.V.保留所有权利。
Parallel two-step phase-shifting interferometry for microscopy is presented, and the recording condition for generalized two-step phase-shifting interferometry is discussed. A 45 degrees tilted cube beamsplitter enables to replicate the orthogonally linear polarized object and reference waves into two parallel beams, respectively. As a consequence, two interferograms with quadrature phase shift are obtained along the two beams, and phase reconstructed with an improved algorithm. To reconstruct the phase distribution from the two-step phase-shifting interferograms, a certain recording condition should be satisfied. However, the recording condition has not ever been discussed before. In this paper, the recording condition for the two-step phase-shifting interferometry is derived and that is: the intensity of reference wave should be no less than two times object wave intensity. (C) 2011 Elsevier B.V. All rights reserved.