Optical properties of metallic films for vertical-cavity optoelectronic devices
Optical properties of metallic films for vertical-cavity optoelectronic devices
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DOI：
10.1364/ao.37.005271
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发表时间：
1998-08-01
期刊：
影响因子：
1.9
通讯作者：
Majewski, ML
中科院分区：
文献类型：
--
作者：
Rakic, AD;Djurisic, AB;Majewski, ML
介绍了在光电子和光学器件中用作反射镜和触点的11种金属的光学功能模型：贵金属(银、金、铜)、铝、铍和过渡金属(铬、镍、钯、铂、钛、钨)。我们用两个简单的唯象模型，Lorentz-Drude(LD)和Brendel-Bormann(BB)，解释了金属介电响应的自由电子和带间部分，光谱范围从0.1到6 eV。结果表明，贵金属的带间吸收可以用BE模型来描述，而对于Al、Be和过渡金属，这两种模型都与实验数据符合得很好。与表面正常结构的测量结果比较表明，利用所提出的金属膜光学函数模型和多层膜计算的矩阵方法，可以准确地描述半导体-金属界面(包括金属多层膜)的反射率和反射相变。(C)1998年美国光学学会。
We present models for the optical functions of 11 metals used as mirrors and contacts in optoelectronic and optical devices: noble metals (Ag, Au, Cu), aluminum, beryllium, and transition metals (Cr, Ni, Pd, Pt, Ti, W). We used two simple phenomenological models, the Lorentz-Drude (LD) and the Brendel-Bormann (BB), to interpret both the free-electron and the interband parts of the dielectric response of metals in a wide spectral range from 0.1 to 6 eV. Our results show that the BE model was needed to describe appropriately the interband absorption in noble metals, while for Al, Be, and the transition metals both models exhibit good agreement with the experimental data. A comparison with measurements on surface normal structures confirmed that the reflectance and the phase change on reflection from semiconductor-metal interfaces (including the case of metallic multilayers) can be accurately described by use of the proposed models for the optical functions of metallic films and the matrix method for multilayer calculations. (C) 1998 Optical Society of America.